PSS bar automatic test machine is used for automatic measurement of LD bar LIV curve, spectrum and backlight. Fully automatic loading and unloading, normal temperature and high temperature dual temperature test bench, and high temperature test can be set by the user. Single or double probe power-on test, NG chip adopts dot marking, and opens the measurement database to users for subsequent screening procedures.
This product is suitable for testing and unloading and sorting of detector components (PIN-TIA or APD devices without aging test). It can be seamlessly connected to the capping machine, and the unloading box is used to load materials to achieve pin insertion and testing. The whole process of, sorting, unloading to the blister box, and finally the finished product.
The 100G, 400G (supporting FEC) of the PSS BER tester series are matched with PSS general instruments, such as optical power meters, optical attenuation, optical switches, extinction ratio testers, clock recovery modules, etc. Module device level testing solutions, including self-loop testing, parallel testing, and serial testing, are widely used in various usage scenarios.
PSS has a complete test program for TO aging test sorting, which perfectly supports the aging test sorting of the originating DFB/TEC-DFB/EML TO, the aging test sorting of the APD end that needs aging, and the PIN-TIA that does not require aging Test sorting. It can realize the efficiency matching of the whole process and the unification of the database, which greatly reduces the requirements for the number of employees and the requirements for equipment database and network maintenance. It can effectively improve the efficiency and reliability of TO production. The specific production plan is as follows.
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